NRI-200 Dispersive Infrared Spectroscopic Evaluation System

Product Details

The NRI-200 (dispersive infrared spectroscopy evaluation system) is a system that can measure the transmittance, reflectance, and refractive index of optical materials in the infrared region all in one unit. Transmittance and reflectance are measured using the dispersive spectroscopy method for parallel plate samples, and refractive index is measured using the minimum deflection angle method for prism samples.

______________________________________________________________________________________________________________

Features:

• Function

• Measurement data (refractive index):

• Measurement data (Transmittance):

• Sample Holder:

• Equipped with transmittance/reflectance measurement function as standard

- Dispersive spectroscopy enables highly accurate transmittance/reflectance measurement.

- As with the minimum deflection angle measurement, since the rotation centers of the following three points are the same, it is possible to measure the angular dependence of transmittance and reflectance.

• Specification:

*1 Chromatic dispersion measurement is a mode that measures the refractive index for each wavelength. The coefficient of the wavelength dispersion formula is calculated using the measurement data in the "glass material data calculation" mode.

*2 Temperature dispersion measurement is a mode that measures the refractive index for each temperature. The coefficient of the temperature dispersion formula is calculated using the measurement data in the "Calculate glass material data" mode. When using a constant temperature cover, there may be errors.

*3 This is the operable range of hardware and software. The actual measurable wavelength range is determined by the final detector signal strength.

*4 Sample-dependent factors such as transmittance and surface accuracy are also factors of error, so we do not guarantee that all samples will satisfy accuracy.

*5 This is the set temperature range of the temperature control stage. The sample temperature is measured using a Pt100 sensor. (The coefficient of the temperature dispersion formula is calculated using this measured value.)

• Standard configuration:

● Ceramic heater light source (wavelength 2 to 14µm)

● Halogen lamp light source (wavelength 0.4 to 3µm)

● Helium lamp (d-line 587.56nm)

● Light source focusing system (high order light automatic switching, chopper mechanism, automatic shutter mechanism, light source switching)

● Spectrometer and diffraction grating

● Irradiation optical system (iris diaphragm, autocollimator)

● θ-2θ automatic rotation stage (built-in rotary encoder)

● Sample holder

　・For refractive index temperature control measurement (for φ15mm irradiation, for φ8mm irradiation)

　・For refractive index non-temperature control measurement (for Φ15mm irradiation, for Φ8mm irradiation)

　・For transmittance parallel plate measurement (thickness 0 to 7mm)

● Temperature control unit (Peltier type temperature control stage, constant temperature cover)

● Observation monitor (for confirming stage position/sample installation)

● Detector

　・Si-InGaAs composite device (wavelength 0.4 to 2.7 µm)

　・MCT light source element (wavelength 2 to 14 µm)

　・Pt100 probe and AD converter (for measuring sample temperature and ambient temperature)

● Lock-in amplifier

● Various controllers (general, communication, stage, temperature control, laser)

● Stand (three-dimensional air spring anti-vibration table, rack for PC) )

Control computer (including software)

• Minimum Declination Method:

• Utility:

- Dimensions

　・Body: About W1800×D900×H1800mm

　・Rack: about W500×D580×H1705mm

- Power supply

　・AC100V ±10V 50/60Hz 25A

- External gas

　・Dry air

* Dry air is not included. When controlling the temperature at a low temperature, it is necessary to replace (or flow) the inside of the constant temperature cover and spray the outside of the constant temperature cover window material to prevent condensation.