NRI-100 Infrared Spectral Refractometer

Product Details

Based on the minimum deflection angle method (Fraunhofer method), a prism-shaped sample is irradiated with monochromatic light of an arbitrary wavelength (1 to 14 µm), and the refractive index of the sample is measured by measuring the angle of the transmitted light with respect to the incident light. It's a device. Refractive index accuracy of 0.0001, which cannot be obtained by conventional measurement methods, can be measured. It is ideal for evaluation of Ge, Si, ZnSe, KRS-5, chalcogenide glass and infrared optical thin films used in infrared windows and infrared lenses.

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Features:

• Measurement item

• Block Diagram:

Measurement Data:

• Sample Holder:

In order to measure with a refractive index accuracy of 0.0001, the surface accuracy of the prism must be 1/8λ or more.

• Specification:

*1 Chromatic dispersion measurement is a mode that measures the refractive index for each wavelength. The coefficient of the wavelength dispersion formula is calculated using the measurement data in the "glass material data calculation" mode.

*2 Temperature dispersion measurement is a mode that measures the refractive index for each temperature. The coefficient of the temperature dispersion formula is calculated using the measurement data in the "Calculate glass material data" mode. When using a constant temperature cover, there may be errors.

*3 This is the operable range of hardware and software. The actual measurable wavelength range is determined by the final detector signal strength.

*4 Sample-dependent factors such as transmittance and surface accuracy are also factors of error, so we do not guarantee that all samples will satisfy accuracy.

*5 This is the set temperature range of the temperature control stage. The sample temperature is measured using a Pt100 sensor. (The coefficient of the temperature dispersion formula is calculated using this measured value.)

• Standard configuration:

- Ceramic heater light source (wavelength 2 to 14µm)

- Halogen lamp light source (wavelength 0.4 to 3µm)

- Helium lamp (d-line 587.56nm)

- Light source focusing system (high order light automatic switching, chopper mechanism, automatic shutter mechanism, light source switching)

- Spectrometer and diffraction grating

- Irradiation optical system (iris diaphragm, autocollimator)

- θ-2θ automatic rotation stage (built-in rotary encoder)

- Sample holder

　・For refractive index temperature control measurement (for φ15mm irradiation, for φ8mm irradiation)

　・For refractive index non-temperature control measurement (for Φ15mm irradiation, for Φ8mm irradiation)

Temperature control unit (Peltier type temperature control stage, constant temperature cover)

Observation monitor (for confirming stage position/sample installation)

Detector

　・Si-InGaAs composite device (wavelength 0.4 to 2.7 µm)

　・MCT light source element (wavelength 2 to 14 µm)

　・Pt100 probe and AD converter (for measuring sample temperature and ambient temperature)

- Lock-in amplifier

- Various controllers (general, communication, stage, temperature control, laser)

- Stand (three-dimensional air spring anti-vibration table, rack for PC) )

- Control computer (including software)

• Minimum Declination Method:

• Utility:

Dimensions

　・Body: About W1800×D900×H1800mm

　・Rack: about W500×D580×H1705mm

Power supply

　・AC100V ±10V 50/60Hz 25A

External gas

　・Dry air

* Dry air is not included. When controlling the temperature at a low temperature, it is necessary to replace (or flow) the inside of the constant temperature cover and spray the outside of the constant temperature cover window material to prevent condensation.