LBC-2 Laser Induced Current Measurement System

MOQ	1 Unit
Port	Tokyo
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Product Details

This equipment is used to measure the photocurrent distribution of various solar cells and photoelectric conversion elements (SiPD, CCD, CMOS).

A measurement method called LBIC [Laser Beam Induced Current] is used.

Equipped with a 520 nm wavelength laser as standard, the sample is moved to XY and the short circuit current (Isc) is measured. A spatial resolution of approximately 10 μm is achieved, and

samples up to 50 x 50 mm can be measured.

In particular, solar cells fabricated by the spin coating method, such as perovskite solar cells, have the problem of different uniformity between the center and edge of the sample surface, making it suitable for evaluation of such samples. It is also suitable for uniformity evaluation of coating materials, etc., for SiPD, CCD, CMOS, etc.

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Features:

This device performs photocurrent mapping by irradiating a sample such as a solar cell with a laser beam and moving it on an XY stage.

It is suitable for uniformity evaluation of perovskite solar cells.

Equipped with a 520 nm laser, it achieves a spatial resolution of approximately 10 μm and can measure samples up to 50 x 50 mm.

By selecting a range from the measurement data, both surface unevenness [(maximum value - minimum value)/(maximum value + minimum value) x 100%] and average value [total valid data/number of valid data] can be obtained. increase.