Innov-X Omega XRF Analyzer Spectrometer
Innov-X Omega XRF Analyzer Spectrometer fluorescence
spectrometer is a handheld XRF analyser. With its ultra
rugged design, diverse field analysis is possible in any
conditions.
The XRF delivers fast and precise identification and analysis
of elements from phosphorus to uranium (P to U).
Advantages of Field Portable XRF.
In the past, studies relied exclusively on expensive and time
consuming analysis based on samples that hopefully
characterised the site. The portable XRF has revolutionised
environmental investigations by allowing you on-the-spot
elemental analysis, in real time. Measure the composition of
soils, debris,
run-off streams, dust wipes, coatings, corings, paints,
plastic and wood instantly,saving you time and money. From
phosphorus to lead,
from low ppm to 100% – in soils, solids, liquids, powders,
cores, fragments, filters & films, slurries and more. One
simple test can analyse up to 25 separate elements in
seconds, including priority pollutants. Determine zonal and
contamination patterns; track pollutant migration caused by
extreme weather; perform real-time surveys to delineate and
define metals present.
In-situ soil analysis for rapid, comprehensive site investigations:
Delineate metals present and contamination patterns
Measure high volume field tests to minimise laboratory
analytical costs
Test soil directly through plastic corings or bagged
samples
Establish contamination boundaries and depth profiles for
remediation and disposal
Collection of samples to produce rock-solid analytical data at the site:
XRF is non-destructive – submit same sample for laboratory
confirmation
Ensure validation requirements/targets are met on-site in
real time
Prepared soil sample testing assures the maximum possible
accuracy
Ultimate XRF Performance with
Silicon Drift Detector (SDD) Technology
The Innov-X Omega Xpress and Omega Xpress Vacuum
Alloy Analyzers utilize the latest in detector technology –
an innovative, large area Silicon Drift Detector (SDD),
commonly used and tested extensively in high end, laboratory
based instrumentation. In comparison to a traditional
Si PiN Diode detector, the SDD provides:
10x improvement in signal to background ratio
Marked resolution improvement, from 195eV to 165eV
The capacity to handle 10x more counts
Key benefts to the user:
>3x improvement in reading speed.
Light element (Mg, Al, Si, P, S) analysis in air
3x better limits of detection for sensitive tramp elements