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VC-250 Sensor Spectral Sensitivity Measurement System

MOQ1 Unit
PortTokyo
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Product Details

This device measures the spectral characteristics (spectral sensitivity/spectral response) of photoelectric conversion elements such as photodiodes and CCD/CMOS image sensors.

By monitoring the amount of light for each wavelength in real time, and using our unique control mechanism, it is possible to irradiate monochromatic light with a certain amount of energy (W/cm 2 ) and number of photons (photon/cm 2 ) for each wavelength.

Under the name of spectral responsivity measurement device, it has been delivered to the National Institute of Advanced Industrial Science and Technology and the Tokyo Metropolitan Industrial Technology Research Center, etc., and is recognized as an industry standard device.

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Features:

  • It is ideal for spectral characteristics evaluation of photodiodes, CCD/CMOS image sensors, etc.
  • It is possible to change the light intensity of monochromatic light up to 3 digits.
  • Highly stable constant energy/constant photon irradiation is possible by the light intensity feedback mechanism by real-time monitor.
  • Optionally, it also supports monochromatic IV measurement at a set wavelength.
  • Spectral characteristics (spectral sensitivity/spectral responsivity) can be easily measured by simply selecting the set energy or number of photons using software.
  • Optional monochromatic IV measurement at set wavelength
  • Supports external control mode. It can also be operated by control commands from the host computer via the GP-IB interface (for CCD/CMOS image sensors)
    • Measurement data (example)

    • Specification:

    • Standard configuration:
  • Xenon lamp 500W
  • Xenon lamp 500W power supply
  • Halogen lamp 400W
  • Halogen lamp 400W power supply
  • Light source focusing optical system (2 light source type)
  • Monochromator
  • Diffraction grating 600 lines/300nm blaze
  • Diffraction grating 600 lines/800nm ​​blaze
  • Diffraction Grating 600 / 1600nm blaze
  • Light amount control mechanism and optical system
  • Si photodiode (for standard detector 300-1100nm)
  • InGaAs photodiodes (for standard detectors 900 to 1300 nm)
  • A source meter for sample current measurement
  • Light-shielding sample chamber/sample stage
  • Laptop computer
  • Dedicated software
  • Instruction manual
    • Optional Accessories:
  • Diffuse reflectance measurement unit (for internal quantum efficiency calculation)
  • InGaAs detector (for long wavelength measurement)
  • Mechanical chopper (for AC measurement)
  • Exit and condensing optical system
  • Lock-in amplifier
  • Various diffraction gratings
  • Various high-order light cut filters
  • Various ammeters
  • Various sample stands and measurement cables
    • External Dimensions:

    -Power supply: AC100V ±10V 50/60Hz 15A

    -Body: Approx. W1700 x D700 x H1460mm

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